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Sensitivity Analysis of 3D Magnetic Induction Tomography (MIT)


Reference:

Lionheart, W., Soleimani, M. and Payton, A., 2003. Sensitivity Analysis of 3D Magnetic Induction Tomography (MIT). In: Proceedings of the 3rd World Congress on Industrial Process Tomography, 2003-09-02 - 2003-09-05, Banff, Alberta.

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Details

Item Type Conference or Workshop Items (Paper)
CreatorsLionheart, W., Soleimani, M. and Payton, A.
DepartmentsFaculty of Engineering & Design > Electronic & Electrical Engineering
RefereedYes
StatusPublished
ID Code12187

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