A new application area for 3D ECT in non-destructive evaluation of dielectric materials
Banasiak, R., Wajman, R., Betiuk, J. and Soleimani, M., 2009. A new application area for 3D ECT in non-destructive evaluation of dielectric materials. In: 3rd International Workshop on Process Tomography, 2009-04-17 - 2009-04-19, Tokyo.
Related documents:This repository does not currently have the full-text of this item.
You may be able to access a copy if URLs are provided below. (Contact Author)
Electrical capacitance tomography (ECT) is relatively mature imaging technique. There has been tremendous improvement in 2D ECT. Three dimensional ECT is now gaining more interests, since some of the computational difficulties dealing with the forward and inverse problems of 3D ECT. At the same time the application areas for ECT are expanding in many different areas of science and technology. The main area of application is the industrial process tomography. In this paper we demonstrate the application of 3D in another very important area, inspection of dielectric materials. We report a new ECT sensor we have developed for this purpose and present some reconstruction results. During experimental stage new numerical sensor model has been developed using FEM modelling.
|Item Type||Conference or Workshop Items (Paper)|
|Creators||Banasiak, R., Wajman, R., Betiuk, J. and Soleimani, M.|
|Departments||Faculty of Engineering & Design > Electronic & Electrical Engineering|
Actions (login required)