Scanning Hall probe imaging of nanoscale magnetic structures

Reference:

Bending, S. J. and Khotkevych, V. V., 2009. Scanning Hall probe imaging of nanoscale magnetic structures. Sensor Letters, 7 (3), pp. 503-506.

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Official URL:

http://dx.doi.org/10.1166/sl.2009.1099

Abstract

Scanning Hall probe microscopy (SHPM) is a novel magnetic imaging technique based on Hall-effect nanosensors with important applications in the quantitative mapping of nanoscale superconducting and ferromagnetic materials. It is highly complementary to other imaging approaches, e.g., Magnetic Force Microscopy (MFM). SHPM is almost completely non-invasive, can be used over a wide range of temperatures (0.3-300 K) and magnetic fields (0-7 T) and is particularly valuable when quantitative maps of magnetic induction are required with very high signal:noise ratios. Recent developments in sensor technology will be described and illustrated by relevant imaging case studies. In addition applications of nanoscale Hall sensors in micro-magnetometry will be reviewed.

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