Pickering, S. G. and Almond, D. P., 2006. Automated defect detection for pulsed transient thermography. American Institute of Physics, pp. 1585-1599. (AIP Conference Proceedings)
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|Item Type ||Conference or Workshop Items (UNSPECIFIED)|
|Creators||Pickering, S. G.and Almond, D. P.|
|Editors||Thompson, D. O.and Chimenti, D. E.|
|Departments||Faculty of Engineering & Design > Mechanical Engineering|
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