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Automated defect detection for pulsed transient thermography


Reference:

Pickering, S. G. and Almond, D. P., 2006. Automated defect detection for pulsed transient thermography. American Institute of Physics, pp. 1585-1599. (AIP Conference Proceedings)

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Details

Item Type Conference or Workshop Items (UNSPECIFIED)
CreatorsPickering, S. G.and Almond, D. P.
EditorsThompson, D. O.and Chimenti, D. E.
DepartmentsFaculty of Engineering & Design > Mechanical Engineering
StatusPublished
ID Code1751

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