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Large volume metrology instrument selection and measurability analysis


Reference:

Muelaner, J. E., Cai, B. and Maropoulos, P. G., 2009. Large volume metrology instrument selection and measurability analysis. In: Proceedings of the 6th CIRP-Sponsored International Conference on Digital Enterprise Technology. Vol. 66. Springer, pp. 1027-1041. (Advances in Intelligent and Soft Computing)

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    http://www.muelaner.com/research/Instrument_Selection_and_Measurability_Analysis/Large_Volume_Metrology_Instrument_Selection_and_Measurability_Analysis-DET.html

    Abstract

    Metrology processes used in the manufacture of large products include tool setting, product verification and flexible metrology enabled automation. The range of applications and instruments available makes the selection of the appropriate instrument for a given task highly complex. Since metrology is a key manufacturing process it should be considered in the early stages of design. This paper provides an overview of the important selection criteria for typical measurement processes and presents some novel selection strategies. Metrics which can be used to assess measurability are also discussed. A prototype instrument selection and measurability analysis application is presented with discussion of how this can be used as the basis for development of a more sophisticated measurement planning tool.

    Details

    Item Type Book Sections
    CreatorsMuelaner, J. E., Cai, B. and Maropoulos, P. G.
    Uncontrolled Keywordsprocess classification, large volume metrology, measurability analysis, process modelling
    DepartmentsFaculty of Engineering & Design > Mechanical Engineering
    Research CentresInnovative Design & Manufacturing Research Centre (IdMRC)
    StatusPublished
    ID Code17632
    Additional Information6th International Conference on Digital Enterprise Technology Dec 14-16, 2009. Hong Kong, Peoples Republic of China

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