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The morphology of nanoporous silicon investigated by time-resolved measurement of changes to the porosity during dissolution


Reference:

Goller, B., Aliev, G. N., Kovalev, D. and Snow, P. A., 2008. The morphology of nanoporous silicon investigated by time-resolved measurement of changes to the porosity during dissolution. In: In-Situ Studies Across Spatial and Temporal Scales for Nanoscience and Technology. Vol. 1146. Warrendale: Materials Research Society, pp. 171-176. (Materials Research Society Symposium Proceedings)

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Abstract

The dissolution rate of porous silicon layers was measured in-situ during etching by HF and NaOH solutions. Cellular models were applied to the structure of the pSi from which the expected rates of change of porosity with time were calculated. Experimental results indicate that the nanostructure of porous silicon may be best modeled as an open-cell foam. This is in contrast to the honeycomb model often used which is not supported by the experimental data.

Details

Item Type Book Sections
CreatorsGoller, B., Aliev, G. N., Kovalev, D. and Snow, P. A.
Uncontrolled Keywordsnano-porous silicon, honeycomb models, naoh solutions, porous silicon layers, in-situ, time resolved measurement, dissolution rates, experimental data, cellular model, open-cell foams
DepartmentsFaculty of Science > Physics
StatusPublished
ID Code18697
Additional Information2008 MRS Fall Meeting, Boston, MA, United states. December 1, 2008 - December 5, 2008

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