The morphology of nanoporous silicon investigated by time-resolved measurement of changes to the porosity during dissolution
Goller, B., Aliev, G. N., Kovalev, D. and Snow, P. A., 2008. The morphology of nanoporous silicon investigated by time-resolved measurement of changes to the porosity during dissolution. In: 2008 MRS Fall Meeting, December 1, 2008 - December 5, 2008, 2008-12-01, Boston, MA. Warrendale: Materials Research Society, pp. 171-176. (Materials Research Society Symposium Proceedings)
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The dissolution rate of porous silicon layers was measured in-situ during etching by HF and NaOH solutions. Cellular models were applied to the structure of the pSi from which the expected rates of change of porosity with time were calculated. Experimental results indicate that the nanostructure of porous silicon may be best modeled as an open-cell foam. This is in contrast to the honeycomb model often used which is not supported by the experimental data.
|Item Type||Conference or Workshop Items (UNSPECIFIED)|
|Creators||Goller, B., Aliev, G. N., Kovalev, D. and Snow, P. A.|
|Uncontrolled Keywords||nano-porous silicon,honeycomb models,naoh solutions,porous silicon layers,in-situ,time resolved measurement,dissolution rates,experimental data,cellular model,open-cell foams|
|Departments||Faculty of Science > Physics|
|Additional Information||2008 MRS Fall Meeting, Boston, MA, United states. December 1, 2008 - December 5, 2008|
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