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Compensating for motion artefacts in x-ray CT using electrical impedance tomography data


Reference:

Pengpan, T., Mitchell, C. N. and Soleimani, M., 2010. Compensating for motion artefacts in x-ray CT using electrical impedance tomography data. In: 6th World Congress on Industrial Process Tomography (WCIPT6), 2010-09-06 - 2010-09-09, Beijing.

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Details

Item Type Conference or Workshop Items (Paper)
CreatorsPengpan, T., Mitchell, C. N. and Soleimani, M.
DepartmentsFaculty of Engineering & Design > Electronic & Electrical Engineering
RefereedYes
StatusPublished
ID Code18853

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