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Crack detection in dielectric objects using electrical capacitance tomography


Reference:

Stewart, V. J., Budd, C. J., Dorn, S. and Soleimani, M., 2010. Crack detection in dielectric objects using electrical capacitance tomography. In: 6th World Congress on Industrial Process Tomography (WCIPT6), 2010-09-06 - 2010-09-09, Beijing.

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Details

Item Type Conference or Workshop Items (Paper)
CreatorsStewart, V. J., Budd, C. J., Dorn, S. and Soleimani, M.
DepartmentsFaculty of Engineering & Design > Electronic & Electrical Engineering
Faculty of Science > Mathematical Sciences
RefereedYes
StatusPublished
ID Code18854

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