Crack detection in dielectric objects using electrical capacitance tomography
Reference:
Stewart, V. J., Budd, C. J., Dorn, S. and Soleimani, M., 2010. Crack detection in dielectric objects using electrical capacitance tomography. In: 6th World Congress on Industrial Process Tomography (WCIPT6), 2010-09-06 - 2010-09-09, Beijing.
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Details
| Item Type | Conference or Workshop Items (Paper) |
| Creators | Stewart, V. J., Budd, C. J., Dorn, S. and Soleimani, M. |
| Departments | Faculty of Engineering & Design > Electronic & Electrical Engineering Faculty of Science > Mathematical Sciences |
| Refereed | Yes |
| Status | Published |
| ID Code | 18854 |
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