Effects of residual surface resistance on the microwave properties of YBCO thin films
Reference:
Porch, A., Huish, D. W., Velichko, A. V., Lancaster, M. J., Abell, J. S., Perry, A. and Almond, D. P., 2005. Effects of residual surface resistance on the microwave properties of YBCO thin films. IEEE Transactions on Applied Superconductivity, 15 (2 (Part 3)), pp. 3706-3709.
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Official URL:
http://dx.doi.org/10.1109/TASC.2005.849403
Details
| Item Type | Articles |
| Creators | Porch, A., Huish, D. W., Velichko, A. V., Lancaster, M. J., Abell, J. S., Perry, A. and Almond, D. P. |
| DOI | 10.1109/TASC.2005.849403 |
| Departments | Faculty of Engineering & Design > Mechanical Engineering |
| Refereed | Yes |
| Status | Published |
| ID Code | 1998 |
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