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Effects of residual surface resistance on the microwave properties of YBCO thin films


Reference:

Porch, A., Huish, D. W., Velichko, A. V., Lancaster, M. J., Abell, J. S., Perry, A. and Almond, D. P., 2005. Effects of residual surface resistance on the microwave properties of YBCO thin films. IEEE Transactions on Applied Superconductivity, 15 (2 (Part 3)), pp. 3706-3709.

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Details

Item Type Articles
CreatorsPorch, A., Huish, D. W., Velichko, A. V., Lancaster, M. J., Abell, J. S., Perry, A. and Almond, D. P.
DOI10.1109/TASC.2005.849403
DepartmentsFaculty of Engineering & Design > Mechanical Engineering
RefereedYes
StatusPublished
ID Code1998

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