Research

Environmental scanning electron and focused ion beam microscopy of novel fillers and binders in cement-based composites


Reference:

Allen, G. C., Heard, P. J., El-Turki, A., Ball, R. J., Soro, J., Gault, C. and Smith, A., 2005. Environmental scanning electron and focused ion beam microscopy of novel fillers and binders in cement-based composites. In: 10th Euroseminar on Microscopy Applied to Building Materials, 2005-06-21 - 2005-06-25, Paisley.

Related documents:

[img]
Preview
PDF (2005_Paisley_Novel fillers) - Requires a PDF viewer such as GSview, Xpdf or Adobe Acrobat Reader
Download (696kB) | Preview

    Details

    Item Type Conference or Workshop Items (Paper)
    CreatorsAllen, G. C., Heard, P. J., El-Turki, A., Ball, R. J., Soro, J., Gault, C. and Smith, A.
    DepartmentsFaculty of Engineering & Design > Architecture & Civil Engineering
    RefereedYes
    StatusPublished
    ID Code20930

    Export

    Actions (login required)

    View Item

    Document Downloads

    More statistics for this item...