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Useful vacancies: Positron beam interrogation of fluorine-vacancy complexes in semiconductor device structures


Reference:

Coleman, P. and Abdulmalik, D., 2008. Useful vacancies: Positron beam interrogation of fluorine-vacancy complexes in semiconductor device structures. Applied Surface Science, 255 (1), pp. 71-74.

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Official URL:

http://dx.doi.org/10.1016/j.apsusc.2008.05.168

Details

Item Type Articles
CreatorsColeman, P.and Abdulmalik, D.
DOI10.1016/j.apsusc.2008.05.168
DepartmentsFaculty of Science > Physics
RefereedYes
StatusPublished
ID Code21724

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