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Observation of vacancy defects at silicon grain boundaries formed via suppressed solid phase epitaxy


Reference:

Dudeck, K. J., Walters, W. D., Knights, A. P. and Coleman, P., 2008. Observation of vacancy defects at silicon grain boundaries formed via suppressed solid phase epitaxy. Journal of Physics D: Applied Physics, 41 (5), 055102.

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Official URL:

http://dx.doi.org/10.1088/0022-3727/41/5/055102

Details

Item Type Articles
CreatorsDudeck, K. J., Walters, W. D., Knights, A. P. and Coleman, P.
DOI10.1088/0022-3727/41/5/055102
DepartmentsFaculty of Science > Physics
RefereedYes
StatusPublished
ID Code21727

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