Observation of vacancy defects at silicon grain boundaries formed via suppressed solid phase epitaxy
Reference:
Dudeck, K. J., Walters, W. D., Knights, A. P. and Coleman, P., 2008. Observation of vacancy defects at silicon grain boundaries formed via suppressed solid phase epitaxy. Journal of Physics D: Applied Physics, 41 (5), 055102.
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Official URL:
http://dx.doi.org/10.1088/0022-3727/41/5/055102
Details
| Item Type | Articles |
| Creators | Dudeck, K. J., Walters, W. D., Knights, A. P. and Coleman, P. |
| DOI | 10.1088/0022-3727/41/5/055102 |
| Departments | Faculty of Science > Physics |
| Refereed | Yes |
| Status | Published |
| ID Code | 21727 |
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