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Internal surfaces of voids and cavities in silicon probed by Positron Annihilation Spectroscopy


Reference:

Potter, N. R. and Coleman, P., 2007. Internal surfaces of voids and cavities in silicon probed by Positron Annihilation Spectroscopy. Physica Status Solidi (C), 4 (10), pp. 3637-3641.

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Official URL:

http://dx.doi.org/10.1002/pssc.200675792

Details

Item Type Articles
CreatorsPotter, N. R.and Coleman, P.
DOI10.1002/pssc.200675792
DepartmentsFaculty of Science > Physics
RefereedYes
StatusPublished
ID Code21731

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