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Time and frequency domain measurements of solitons in subwavelength silicon waveguides using a cross-correlation technique


Reference:

Ding, W., Gorbach, A. V., Wadsworth, W. J., Knight, J. C., Skryabin, D., Strain, M. J., Sorel, M. and De la Rue, R. M., 2010. Time and frequency domain measurements of solitons in subwavelength silicon waveguides using a cross-correlation technique. Optics Express, 18 (25), pp. 26625-26630.

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Official URL:

http://dx.doi.org/10.1364/OE.18.026625

Abstract

We report time domain measurements of the group-velocity-dispersion-induced and nonlinearity-induced chirping of femtosecond pulses in subwavelength silicon-on-insulator waveguides. We observe that at a critical input power level, these two effects compensate each other leading to soliton formation. Formation of the fundamental optical soliton is observed at a peak power of a few Watts inside the waveguide. Interferometric cross-correlation traces reveal compression of the soliton pulses, while spectral measurements show pronounced dispersive (Cherenkov) waves emitted by solitons into the wavelength range of normal group velocity dispersion.

Details

Item Type Articles
CreatorsDing, W., Gorbach, A. V., Wadsworth, W. J., Knight, J. C., Skryabin, D., Strain, M. J., Sorel, M. and De la Rue, R. M.
DOI10.1364/OE.18.026625
DepartmentsFaculty of Science > Physics
Research CentresCentre for Photonics and Photonic Materials
RefereedYes
StatusPublished
ID Code22873

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