Time and frequency domain measurements of solitons in subwavelength silicon waveguides using a cross-correlation technique

Reference:

Ding, W., Gorbach, A. V., Wadsworth, W. J., Knight, J. C., Skryabin, D., Strain, M. J., Sorel, M. and De la Rue, R. M., 2010. Time and frequency domain measurements of solitons in subwavelength silicon waveguides using a cross-correlation technique. Optics Express, 18 (25), pp. 26625-26630.

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Official URL:

http://dx.doi.org/10.1364/OE.18.026625

Abstract

We report time domain measurements of the group-velocity-dispersion-induced and nonlinearity-induced chirping of femtosecond pulses in subwavelength silicon-on-insulator waveguides. We observe that at a critical input power level, these two effects compensate each other leading to soliton formation. Formation of the fundamental optical soliton is observed at a peak power of a few Watts inside the waveguide. Interferometric cross-correlation traces reveal compression of the soliton pulses, while spectral measurements show pronounced dispersive (Cherenkov) waves emitted by solitons into the wavelength range of normal group velocity dispersion.

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