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Measurability Characteristics Mapping for Large Volume Metrology Instruments Selection


Reference:

Cai, B., Dai, W., Muelaner, J. E. and Maropoulos, P. G., 2010. Measurability Characteristics Mapping for Large Volume Metrology Instruments Selection. In: The 7th International Conference on Manufacturing Research (ICMR09), 2009-09-08 - 2009-09-10, University of Warwick.

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    Abstract

    Measurement and verification of products and processes during the early design is attracting increasing interest from high value manufacturing industries. Measurement planning is deemed as an effective means to facilitate the integration of the metrology activity into a wider range of production processes. However, the literature reveals that there are very few research efforts in this field, especially regarding large volume metrology. This paper presents a novel approach to accomplish instruments selection, the first stage of measurement planning process, by mapping measurability characteristics between specific measurement assignments and instruments.

    Details

    Item Type Conference or Workshop Items (Paper)
    CreatorsCai, B., Dai, W., Muelaner, J. E. and Maropoulos, P. G.
    DepartmentsFaculty of Engineering & Design > Mechanical Engineering
    RefereedNo
    StatusPublished
    ID Code26433
    Additional InformationPublished in 2010 in Proceedings of the Advances in Manufacturing Technology - XXIII

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