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Determination of the Poisson ratio of (001) and (111) oriented thin films of In(2)O(3) by synchrotron-based x-ray diffraction


Reference:

Zhang, K. H. L., Regoutz, A., Palgrave, R. G., Payne, D. J., Egdell, R. G., Walsh, A., Collins, S. P., Wermeille, D. and Cowley, R. A., 2011. Determination of the Poisson ratio of (001) and (111) oriented thin films of In(2)O(3) by synchrotron-based x-ray diffraction. Physical Review B, 84 (23), 233301.

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    Official URL:

    http://dx.doi.org/10.1103/PhysRevB.84.233301

    Abstract

    The Poisson ratio. of In(2)O(3) has been determined by measurement of the covariation of in-plane and out-of-plane lattice parameters of strained thin films grown epitaxially on (111) and (001) oriented cubic Y-stabilized ZrO(2) substrates. The experimental results are in good agreement with values for. calculated using atomistic simulation procedures.

    Details

    Item Type Articles
    CreatorsZhang, K. H. L., Regoutz, A., Palgrave, R. G., Payne, D. J., Egdell, R. G., Walsh, A., Collins, S. P., Wermeille, D. and Cowley, R. A.
    DOI10.1103/PhysRevB.84.233301
    DepartmentsFaculty of Science > Chemistry
    Research CentresCentre for Sustainable Chemical Technologies
    Publisher StatementWalsh_PRB_2011_84_233301.pdf: Zhang, K. H. L., Regoutz, A., Palgrave, R. G., Payne, D. J., Egdell, R. G., Walsh, A., Collins, S. P., Wermeille, D. and Cowley, R. A., 2011. Determination of the Poisson ratio of (001) and (111) oriented thin films of In(2)O(3) by synchrotron-based x-ray diffraction. Physical Review B, 84 (23), 233301. Copyright (2011) by the American Physical Society
    RefereedYes
    StatusPublished
    ID Code28003

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