Determination of the Poisson ratio of (001) and (111) oriented thin films of In(2)O(3) by synchrotron-based x-ray diffraction
Reference:
Zhang, K. H. L., Regoutz, A., Palgrave, R. G., Payne, D. J., Egdell, R. G., Walsh, A., Collins, S. P., Wermeille, D. and Cowley, R. A., 2011. Determination of the Poisson ratio of (001) and (111) oriented thin films of In(2)O(3) by synchrotron-based x-ray diffraction. Physical Review B, 84 (23), 233301.
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Official URL:
http://dx.doi.org/10.1103/PhysRevB.84.233301
Abstract
The Poisson ratio. of In(2)O(3) has been determined by measurement of the covariation of in-plane and out-of-plane lattice parameters of strained thin films grown epitaxially on (111) and (001) oriented cubic Y-stabilized ZrO(2) substrates. The experimental results are in good agreement with values for. calculated using atomistic simulation procedures.
Details
| Item Type | Articles |
| Creators | Zhang, K. H. L., Regoutz, A., Palgrave, R. G., Payne, D. J., Egdell, R. G., Walsh, A., Collins, S. P., Wermeille, D. and Cowley, R. A. |
| DOI | 10.1103/PhysRevB.84.233301 |
| Departments | Faculty of Science > Chemistry |
| Research Centres | Centre for Sustainable Chemical Technologies |
| Publisher Statement | Walsh_PRB_2011_84_233301.pdf: Zhang, K. H. L., Regoutz, A., Palgrave, R. G., Payne, D. J., Egdell, R. G., Walsh, A., Collins, S. P., Wermeille, D. and Cowley, R. A., 2011. Determination of the Poisson ratio of (001) and (111) oriented thin films of In(2)O(3) by synchrotron-based x-ray diffraction. Physical Review B, 84 (23), 233301. Copyright (2011) by the American Physical Society |
| Refereed | Yes |
| Status | Published |
| ID Code | 28003 |
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