Research

Raman spectroscopy of nonstacked graphene flakes produced by plasma microjet deposition


Reference:

Passoni, M., Russo, V., Dellasega, D., Causa, F., Ghezzi, F., Wolverson, D. and Bottani, C. E., 2012. Raman spectroscopy of nonstacked graphene flakes produced by plasma microjet deposition. Journal of Raman Spectroscopy, 43 (7), pp. 884-888.

Related documents:

This repository does not currently have the full-text of this item.
You may be able to access a copy if URLs are provided below. (Contact Author)

Official URL:

http://dx.doi.org/10.1002/jrs.3111

Abstract

An extensive Raman investigation of few-layer graphene structures, obtained using a plasma microjet technique, is presented. Raman spectroscopy represents a unique method to characterize specific features of these systems. Excitation energies both in the visible and in the deep ultraviolet range are exploited, allowing to extract the main structural properties of the in-house deposited samples. Particular attention is given to the determination of the stacking order properties of these few-layer graphene structures. The results presented here also validate the plasma microjet as an efficient deposition technique to obtain graphene-based systems with a low number of layers and reduced coupling on well defined and spatially localized areas.

Details

Item Type Articles
CreatorsPassoni, M., Russo, V., Dellasega, D., Causa, F., Ghezzi, F., Wolverson, D. and Bottani, C. E.
DOI10.1002/jrs.3111
DepartmentsFaculty of Science > Physics
RefereedYes
StatusPublished
ID Code29477

Export

Actions (login required)

View Item