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An analytical study of the pulsed thermography defect detection limit


Reference:

Almond, D. P. and Pickering, S. G., 2012. An analytical study of the pulsed thermography defect detection limit. Journal of Applied Physics, 111 (9), 093510.

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    Official URL:

    http://dx.doi.org/10.1063/1.4704684

    Details

    Item Type Articles
    CreatorsAlmond, D. P.and Pickering, S. G.
    DOI10.1063/1.4704684
    DepartmentsFaculty of Engineering & Design > Mechanical Engineering
    Research CentresMaterials Research Centre
    Publisher StatementAlmond_-_Pulsed_thermography_defect_detection_limit.pdf: Copyright (2012) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Almond, D. P. and Pickering, S. G., 2012. An analytical study of the pulsed thermography defect detection limit. Journal of Applied Physics, 111 (9), 093510, and may be found at http://dx.doi.org/10.1063/1.4704684
    RefereedYes
    StatusPublished
    ID Code30048

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