An analytical study of the pulsed thermography defect detection limit and the defect aspect ratio greater than two rule-of-thumb
Almond, D.P. and Pickering, S.G., 2012. An analytical study of the pulsed thermography defect detection limit and the defect aspect ratio greater than two rule-of-thumb. AIP Conference Proceedings, 1430, pp. 467-474.
Related documents:This repository does not currently have the full-text of this item.
You may be able to access a copy if URLs are provided below. (Contact Author)
A simple modification of the one-dimensional expression for the thermal contrast of a layer provides an accurate prediction of peak contrast temperature and contrast peak time for defects of all aspect ratios. The analytical results have been shown to agree with numerical modelling. The rule-of-thumb is not generally valid as peak contrast is shown to depend critically on defect depth and absorbed excitation/flash energy as well as defect aspect ratio. © 2012 American Institute of Physics.
|Creators||Almond, D.P.and Pickering, S.G.|
|Departments||Faculty of Engineering & Design > Mechanical Engineering|
Actions (login required)