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An analytical study of the pulsed thermography defect detection limit and the defect aspect ratio greater than two rule-of-thumb


Reference:

Almond, D.P. and Pickering, S.G., 2012. An analytical study of the pulsed thermography defect detection limit and the defect aspect ratio greater than two rule-of-thumb. AIP Conference Proceedings, 1430, pp. 467-474.

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Official URL:

http://dx.doi.org/10.1063/1.4716264

Abstract

A simple modification of the one-dimensional expression for the thermal contrast of a layer provides an accurate prediction of peak contrast temperature and contrast peak time for defects of all aspect ratios. The analytical results have been shown to agree with numerical modelling. The rule-of-thumb is not generally valid as peak contrast is shown to depend critically on defect depth and absorbed excitation/flash energy as well as defect aspect ratio. © 2012 American Institute of Physics.

Details

Item Type Articles
CreatorsAlmond, D.P.and Pickering, S.G.
DOI10.1063/1.4716264
DepartmentsFaculty of Engineering & Design > Mechanical Engineering
RefereedYes
StatusPublished
ID Code31016

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