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An objective comparison of pulsed, lock-in, and frequency modulated thermal wave imaging


Reference:

Chatterjee, K., Tuli, S., Pickering, S.G. and Almond, D.P., 2012. An objective comparison of pulsed, lock-in, and frequency modulated thermal wave imaging. AIP Conference Proceedings, 1430, pp. 1812-1815.

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    Official URL:

    http://dx.doi.org/10.1063/1.4716431

    Abstract

    An objective comparison of three different thermal non-destructive evaluation (NDE) techniques - pulsed thermography (PT), lock-in (LI) thermography, and frequency modulated thermal wave imaging (FMTWI), has been carried out on a CFRP sample. The matched energy comparison shows that on the basis of computed SNR, the shallow defects are better detected by PT, while deeper defects are detected equally by all techniques. © 2012 American Institute of Physics.

    Details

    Item Type Articles
    CreatorsChatterjee, K., Tuli, S., Pickering, S.G. and Almond, D.P.
    DOI10.1063/1.4716431
    DepartmentsFaculty of Engineering & Design > Mechanical Engineering
    Publisher StatementPickering_2012_AIP.pdf: Copyright (2012) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Chatterjee, K, Tuli, S, Pickering, SG & Almond, DP 2012, 'An objective comparison of pulsed, lock-in, and frequency modulated thermal wave imaging' AIP Conference Proceedings, vol 1430, pp. 1812-1815, and may be found at http://link.aip.org/link/doi/10.1063/1.4716431
    RefereedNo
    StatusPublished
    ID Code31017

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