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Waveguide artefacts in terahertz near field imaging


Reference:

Misra, M., Andrews, S. R. and Maier, S. A., 2012. Waveguide artefacts in terahertz near field imaging. Applied Physics Letters, 100 (19), 191109.

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    Official URL:

    http://dx.doi.org/10.1063/1.4714532

    Abstract

    We report experimental and computational studies of the behaviour of a photoconductive THz near field probe when imaging a simple planar metal-dielectric structure. We show that the excitation of waveguide modes in the gap between sample and probe, together with diffraction at the probe, must generally be taken into account when analysing images and that electromagnetic simulations provide a very useful aid to interpretation.

    Details

    Item Type Articles
    CreatorsMisra, M., Andrews, S. R. and Maier, S. A.
    DOI10.1063/1.4714532
    DepartmentsFaculty of Science > Physics
    Publisher StatementAndres_APL_2012_100_191109.pdf: Copyright 2012 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Misra, M., Andrews, S. R. and Maier, S. A., 2012. Waveguide artefacts in terahertz near field imaging. Applied Physics Letters, 100 (19), p. 191109 and may be found at http://dx.doi.org/10.1063/1.4714532
    RefereedYes
    StatusPublished
    ID Code31200

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