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Edge effects and a method of defect sizing for transient thermography


Reference:

Almond, D. P. and Lau, S. K., 1993. Edge effects and a method of defect sizing for transient thermography. Applied Physics Letters, 62 (25), 3369.

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Official URL:

http://dx.doi.org/10.1063/1.109074

Abstract

Thermal edge effects for a cracklike defect have been calculated using the Wiener–Hopf technique. These have been used in an analytical model to explain transient thermographic image formation. The analysis has led to a simple method for defect sizing which is demonstrated using experimental results.

Details

Item Type Articles
CreatorsAlmond, D. P.and Lau, S. K.
DOI10.1063/1.109074
DepartmentsFaculty of Engineering & Design > Mechanical Engineering
Research CentresMaterials Research Centre
Bath Institute for Complex Systems (BICS)
RefereedYes
StatusPublished
ID Code34043

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