Formation of mesophase surfactant-templated silica thin films from acidic solutions
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The formation of mesophase silica-surfactant thin films at the air/solution interface has been studied in situ using off-specular X-ray reflectivity, Brewster angle microscopy and small angle scattering. Results for cetyltrimethylammonium bromide-templated films suggest that the formation mechanism is strongly dependent on the silica:surfactant ratio, and this is confirmed by studies on the subphase solutions using time-resolved small angle X-ray and neutron scattering. Results of similar investigations for films templated with Pluronic((R)) P123 triblock copolymer surfactant also show a strong dependence of mesostructure development oil silica:surfactant ratio. A general formation mechanism for mesophase growth and thin film development is proposed.
|Item Type||Conference or Workshop Items (UNSPECIFIED)|
|Creators||Edler, K. J., Brennan, T., Fernandez-Martin, C. and Roser, S. J.|
|Departments||Faculty of Science > Chemistry|
|Additional Information||ID number: ISI:000227357207044|
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