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Structural studies on surfactant-templated silica films grown at the air/water interface


Reference:

Edler, K. J., Goldar, A., Hughes, A. V., Roser, S. J. and Mann, S., 2001. Structural studies on surfactant-templated silica films grown at the air/water interface. Microporous and Mesoporous Materials, 44, pp. 661-670.

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Abstract

In situ characterisation of a growing surfactant-templated silica film has been carried out by X-ray reflectivity, diffuse X-ray scattering from the surface. Brewster angle microscopy and surface pressure measurements. The results indicate an unexpected film growth mechanism where layered structures form in solution and diffuse to the interface after some critical induction period. (C) 2001 Elsevier Science B.V. All rights reserved.

Details

Item Type Articles
CreatorsEdler, K. J., Goldar, A., Hughes, A. V., Roser, S. J. and Mann, S.
DepartmentsFaculty of Science > Chemistry
RefereedYes
StatusPublished
ID Code5227
Additional InformationID number: ISI:000169557700079

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