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Focussed Ion Beam post-fabrication processing of superluminescent diodes – a detailed analysis


Reference:

Causa, F., Milani, M., Sarma, J., Tatti, F. and Ferraro, L., 2007. Focussed Ion Beam post-fabrication processing of superluminescent diodes – a detailed analysis. In: Scanning 2007, 2007-01-01, Monterey, California (USA).

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Details

Item Type Conference or Workshop Items (Paper)
CreatorsCausa, F., Milani, M., Sarma, J., Tatti, F. and Ferraro, L.
DepartmentsFaculty of Engineering & Design > Electronic & Electrical Engineering
RefereedNo
StatusPublished
ID Code5745

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