Research

Edge-based finite-element analysis of the field patterns in V-shaped microshield line


Reference:

Lu, M. and Leonard, P. J., 2004. Edge-based finite-element analysis of the field patterns in V-shaped microshield line. Microwave and Optical Technology Letters, 41 (1), pp. 43-47.

Related documents:

This repository does not currently have the full-text of this item.
You may be able to access a copy if URLs are provided below.

Abstract

In this paper, field patterns in V-shaped microshield transmission line are calculated by using the edge-based finite element method. The dependence of the field patterns upon the thickness of metallic signal strip and the dielectric constant of dielectric substrate IS presented. The figures in this paper have important values in the design of microshield lines in microwave and millimeter-wave integrated circuits. (C) 2004 Wiley Periodicals. Inc.

Details

Item Type Articles
CreatorsLu, M.and Leonard, P. J.
DOI10.1002/mop.20041
DepartmentsFaculty of Engineering & Design > Electronic & Electrical Engineering
RefereedYes
StatusPublished
ID Code5948
Additional InformationID number: ISI:000220208600016

Export

Actions (login required)

View Item