Edge-based finite-element analysis of the field patterns in V-shaped microshield line
Lu, M. and Leonard, P. J., 2004. Edge-based finite-element analysis of the field patterns in V-shaped microshield line. Microwave and Optical Technology Letters, 41 (1), pp. 43-47.
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In this paper, field patterns in V-shaped microshield transmission line are calculated by using the edge-based finite element method. The dependence of the field patterns upon the thickness of metallic signal strip and the dielectric constant of dielectric substrate IS presented. The figures in this paper have important values in the design of microshield lines in microwave and millimeter-wave integrated circuits. (C) 2004 Wiley Periodicals. Inc.
|Creators||Lu, M.and Leonard, P. J.|
|Departments||Faculty of Engineering & Design > Electronic & Electrical Engineering|
|Additional Information||ID number: ISI:000220208600016|
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