A novel algorithm for fault classification in transmission lines using a combined adaptive network and fuzzy inference system
Yeo, S. M., Kim, C. H., Hong, K. S., Lim, Y. B., Aggarwal, R. K., Johns, A. T. and Choi, M. S., 2003. A novel algorithm for fault classification in transmission lines using a combined adaptive network and fuzzy inference system. International Journal of Electrical Power & Energy Systems, 25 (9), pp. 747-758.
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Accurate detection and classification of faults on transmission lines is vitally important. In this respect, many different types of faults occur, inter alia low impedance faults (LIF) and high impedance faults (HIF). The latter in particular pose difficulties for the commonly employed conventional overcurrent and distance relays, and if not detected, can cause damage to expensive equipment, threaten life and cause fire hazards. Although HIFs are far less common than LIFs, it is imperative that any protection device should be able to satisfactorily deal with both HIFs and LIFs. Because of the randomness and asymmetric characteristics of HIFs, the modelling of HIF is difficult and many papers relating to various HIF models have been published. In this paper, the model of HIFs in transmission lines is accomplished using the characteristics of a ZnO arrester, which is then implemented within the overall transmission system model based on the electromagnetic transients programme. This paper proposes an algorithm for fault detection and classification for both LIFs and HIFs using Adaptive Network-based Fuzzy Inference System (ANFIS). The inputs into ANFIS are current signals only based on Root-Mean-Square values of three-phase currents and zero sequence current. The performance of the proposed algorithm is tested on a typical 154 kV Korean transmission line system under various fault conditions. Test results show that the ANFIS can detect and classify faults including (LIFs and HIFs) accurately within half a cycle. (C) 2003 Elsevier Science Ltd. All rights reserved.
|Creators||Yeo, S. M., Kim, C. H., Hong, K. S., Lim, Y. B., Aggarwal, R. K., Johns, A. T. and Choi, M. S.|
|Departments||Faculty of Engineering & Design > Electronic & Electrical Engineering|
|Additional Information||ID number: ISI:000185055700009|
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