Research

Measurement and Modelling of MIC Components Using Conductive Lithographic Films


Reference:

Shepherd, P. R., Taylor, C., Evans, P. S. A. and Harrison, D. J., 2001. Measurement and Modelling of MIC Components Using Conductive Lithographic Films. In: 31st European Microwave Conference, 2001-09-25 - 2001-09-27, London.

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Abstract

Conductive Lithographic Films (CLFs) have previously demonstrated useful properties in printed microwave circuits, combining low cost with high speed of manufacture. In this paper we examine the formation of various passive components via the CLF process, which enables further integration of printed microwave integrated circuits. The printed components include vias, resistors and overlay capacitors, and offer viable alternatives to traditional manufacturing processes for Microwave Integrated Circuits (MICs). Manufacturing data, measurements on test structures and equivalent circuit modelling for a range of CLF circuit structures are presented.

Details

Item Type Conference or Workshop Items (Paper)
CreatorsShepherd, P. R., Taylor, C., Evans, P. S. A. and Harrison, D. J.
DepartmentsFaculty of Engineering & Design > Electronic & Electrical Engineering
RefereedNo
StatusPublished
ID Code6135

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