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Quantitative simulation of in situ reflectance data from metal organic vapour phase epitaxy of GaN on sapphire


Reference:

Liu, C. W. and Watson, I. M., 2007. Quantitative simulation of in situ reflectance data from metal organic vapour phase epitaxy of GaN on sapphire. Semiconductor Science and Technology, 22 (6), pp. 629-635.

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Details

Item Type Articles
CreatorsLiu, C. W.and Watson, I. M.
DepartmentsFaculty of Science > Physics
RefereedYes
StatusPublished
ID Code8628
Additional InformationID number: ISI:000247046900008

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