Positron depth profiling in solid surface layers
Reference:
Grynszpan, R. I., Anwand, W., Brauer, G. and Coleman, P. G., 2007. Positron depth profiling in solid surface layers. Annales De Chimie-Science Des Materiaux, 32 Jul-Aug (4), pp. 365-382.
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Details
| Item Type | Articles |
| Creators | Grynszpan, R. I., Anwand, W., Brauer, G. and Coleman, P. G. |
| Departments | Faculty of Science > Physics |
| Refereed | Yes |
| Status | Published |
| ID Code | 8648 |
| Additional Information | ID number: ISI:000248828100005 |
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