Research

Positron depth profiling in solid surface layers


Reference:

Grynszpan, R. I., Anwand, W., Brauer, G. and Coleman, P. G., 2007. Positron depth profiling in solid surface layers. Annales De Chimie-Science Des Materiaux, 32 Jul-Aug (4), pp. 365-382.

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Details

Item Type Articles
CreatorsGrynszpan, R. I., Anwand, W., Brauer, G. and Coleman, P. G.
DepartmentsFaculty of Science > Physics
RefereedYes
StatusPublished
ID Code8648
Additional InformationID number: ISI:000248828100005

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