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Vacancy-type defects in TiO2/SiO2/SiC dielectric stacks


Reference:

Coleman, P. G., Burrows, C. P., Mahapatra, R. and Wright, N. G., 2007. Vacancy-type defects in TiO2/SiO2/SiC dielectric stacks. Journal of Applied Physics, 102 (1).

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Details

Item Type Articles
CreatorsColeman, P. G., Burrows, C. P., Mahapatra, R. and Wright, N. G.
DepartmentsFaculty of Science > Physics
RefereedYes
StatusPublished
ID Code8672
Additional InformationID number: ISI:000248018300081

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