Vacancy-type defects in TiO2/SiO2/SiC dielectric stacks
Reference:
Coleman, P. G., Burrows, C. P., Mahapatra, R. and Wright, N. G., 2007. Vacancy-type defects in TiO2/SiO2/SiC dielectric stacks. Journal of Applied Physics, 102 (1).
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Details
| Item Type | Articles |
| Creators | Coleman, P. G., Burrows, C. P., Mahapatra, R. and Wright, N. G. |
| Departments | Faculty of Science > Physics |
| Refereed | Yes |
| Status | Published |
| ID Code | 8672 |
| Additional Information | ID number: ISI:000248018300081 |
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