In situ monitoring of GaN epitaxial lateral overgrowth by spectroscopic reflectometry
Reference:
Liu, C., Stepanov, S., Shields, P. A., Gott, A., Wang, W. N., Steimetz, E. and Zettler, J. T., 2006. In situ monitoring of GaN epitaxial lateral overgrowth by spectroscopic reflectometry. Applied Physics Letters, 88 (10).
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Details
| Item Type | Articles |
| Creators | Liu, C., Stepanov, S., Shields, P. A., Gott, A., Wang, W. N., Steimetz, E. and Zettler, J. T. |
| Departments | Faculty of Science > Physics |
| Refereed | Yes |
| Status | Published |
| ID Code | 8749 |
| Additional Information | ID number: ISI:000235905800003 |
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