Influence of the tip of the scanning tunneling microscope on surface electron lifetimes
Reference:
Crampin, S., 2006. Influence of the tip of the scanning tunneling microscope on surface electron lifetimes. Surface Science, 600 (18), pp. 4280-4284.
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Details
| Item Type | Articles |
| Creators | Crampin, S. |
| Departments | Faculty of Science > Physics |
| Refereed | Yes |
| Status | Published |
| ID Code | 8785 |
| Additional Information | ID number: ISI:000241450600153 |
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