Research

Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies


Reference:

Brauer, G., Anwand, W., Eichhorn, F., Skorupa, W., Hofer, C., Teichert, C., Kuriplach, J., Cizek, J., Prochazka, I., Coleman, P. G., Nozawa, T. and Kohyama, A., 2006. Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies. Applied Surface Science, 252 (9), pp. 3342-3351.

Related documents:

This repository does not currently have the full-text of this item.
You may be able to access a copy if URLs are provided below.

Details

Item Type Articles
CreatorsBrauer, G., Anwand, W., Eichhorn, F., Skorupa, W., Hofer, C., Teichert, C., Kuriplach, J., Cizek, J., Prochazka, I., Coleman, P. G., Nozawa, T. and Kohyama, A.
DepartmentsFaculty of Science > Physics
RefereedYes
StatusPublished
ID Code8798
Additional InformationID number: ISI:000236021300042

Export

Actions (login required)

View Item