Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies
Reference:
Brauer, G., Anwand, W., Eichhorn, F., Skorupa, W., Hofer, C., Teichert, C., Kuriplach, J., Cizek, J., Prochazka, I., Coleman, P. G., Nozawa, T. and Kohyama, A., 2006. Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies. Applied Surface Science, 252 (9), pp. 3342-3351.
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Details
| Item Type | Articles |
| Creators | Brauer, G., Anwand, W., Eichhorn, F., Skorupa, W., Hofer, C., Teichert, C., Kuriplach, J., Cizek, J., Prochazka, I., Coleman, P. G., Nozawa, T. and Kohyama, A. |
| Departments | Faculty of Science > Physics |
| Refereed | Yes |
| Status | Published |
| ID Code | 8798 |
| Additional Information | ID number: ISI:000236021300042 |
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