Second-generation quantum-well sensors for room-temperature scanning Hall probe microscopy
Reference:
Pross, A., Crisan, A. I., Bending, S. J., Mosser, V. and Konczykowski, M., 2005. Second-generation quantum-well sensors for room-temperature scanning Hall probe microscopy. Journal of Applied Physics, 97 (9).
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Details
| Item Type | Articles |
| Creators | Pross, A., Crisan, A. I., Bending, S. J., Mosser, V. and Konczykowski, M. |
| Departments | Faculty of Science > Physics |
| Refereed | Yes |
| Status | Published |
| ID Code | 8846 |
| Additional Information | ID number: ISI:000229155600115 |
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