Research

Second-generation quantum-well sensors for room-temperature scanning Hall probe microscopy


Reference:

Pross, A., Crisan, A. I., Bending, S. J., Mosser, V. and Konczykowski, M., 2005. Second-generation quantum-well sensors for room-temperature scanning Hall probe microscopy. Journal of Applied Physics, 97 (9).

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Details

Item Type Articles
CreatorsPross, A., Crisan, A. I., Bending, S. J., Mosser, V. and Konczykowski, M.
DepartmentsFaculty of Science > Physics
RefereedYes
StatusPublished
ID Code8846
Additional InformationID number: ISI:000229155600115

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