Characterization of the interface region during the agglomeration of silicon nanocrystals in silicon dioxide
Reference:
Pi, X. D., Coleman, P. G., Harding, R., Davies, G. and Gwilliam, R. M., 2004. Characterization of the interface region during the agglomeration of silicon nanocrystals in silicon dioxide. Journal of Applied Physics, 95 (12), pp. 8155-8159.
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Details
| Item Type | Articles |
| Creators | Pi, X. D., Coleman, P. G., Harding, R., Davies, G. and Gwilliam, R. M. |
| Departments | Faculty of Science > Physics |
| Refereed | Yes |
| Status | Published |
| ID Code | 8931 |
| Additional Information | ID number: ISI:000221843400093 |
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