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Sensitivity of positron annihilation spectroscopy to energy contamination in low energy boron ion implantation


Reference:

Knights, A. P. and Coleman, P. G., 2004. Sensitivity of positron annihilation spectroscopy to energy contamination in low energy boron ion implantation. In: Positron Annihilation - Icpa-13, Proceedings. Vol. 445-4. , pp. 123-125. (Materials Science Forum)

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Details

Item Type Book Sections
CreatorsKnights, A. P.and Coleman, P. G.
DepartmentsFaculty of Science > Physics
StatusPublished
ID Code8949
Additional InformationID number: ISI:000189406800035

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