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Nanocrystalline Si studied by beam-based positron annihilation spectroscopy


Reference:

Coleman, P. G., Pi, X. D., Gwilliam, R. M. and Sealy, B. J., 2004. Nanocrystalline Si studied by beam-based positron annihilation spectroscopy. (Materials Science Forum)

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Details

Item Type Conference or Workshop Items (UNSPECIFIED)
CreatorsColeman, P. G., Pi, X. D., Gwilliam, R. M. and Sealy, B. J.
DepartmentsFaculty of Science > Physics
StatusPublished
ID Code8973
Additional InformationID number: ISI:000189406800016

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