Nanocrystalline Si studied by beam-based positron annihilation spectroscopy
Reference:
Coleman, P. G., Pi, X. D., Gwilliam, R. M. and Sealy, B. J., 2004. Nanocrystalline Si studied by beam-based positron annihilation spectroscopy. In: Positron Annihilation - Icpa-13, Proceedings. Vol. 445-4. , pp. 66-68. (Materials Science Forum)
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Details
| Item Type | Book Sections |
| Creators | Coleman, P. G., Pi, X. D., Gwilliam, R. M. and Sealy, B. J. |
| Departments | Faculty of Science > Physics |
| Status | Published |
| ID Code | 8973 |
| Additional Information | ID number: ISI:000189406800016 |
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