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Nanocrystalline Si studied by beam-based positron annihilation spectroscopy


Reference:

Coleman, P. G., Pi, X. D., Gwilliam, R. M. and Sealy, B. J., 2004. Nanocrystalline Si studied by beam-based positron annihilation spectroscopy. In: Positron Annihilation - Icpa-13, Proceedings. Vol. 445-4. , pp. 66-68. (Materials Science Forum)

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Details

Item Type Book Sections
CreatorsColeman, P. G., Pi, X. D., Gwilliam, R. M. and Sealy, B. J.
DepartmentsFaculty of Science > Physics
StatusPublished
ID Code8973
Additional InformationID number: ISI:000189406800016

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