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Positron annihilation spectroscopy of the interface between nanocrystalline Si and SiO2


Reference:

Pi, X. D., Coleman, P. G., Harding, R., Davies, G., Gwilliam, R. M. and Sealy, B. J., 2003. Positron annihilation spectroscopy of the interface between nanocrystalline Si and SiO2. Physica B Condensed Matter, 340, pp. 1094-1098.

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Details

Item Type Articles
CreatorsPi, X. D., Coleman, P. G., Harding, R., Davies, G., Gwilliam, R. M. and Sealy, B. J.
DepartmentsFaculty of Science > Physics
RefereedYes
StatusPublished
ID Code9021
Additional InformationID number: ISI:000188300200231

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