Positron annihilation spectroscopy of the interface between nanocrystalline Si and SiO2
Reference:
Pi, X. D., Coleman, P. G., Harding, R., Davies, G., Gwilliam, R. M. and Sealy, B. J., 2003. Positron annihilation spectroscopy of the interface between nanocrystalline Si and SiO2. Physica B Condensed Matter, 340, pp. 1094-1098.
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Details
| Item Type | Articles |
| Creators | Pi, X. D., Coleman, P. G., Harding, R., Davies, G., Gwilliam, R. M. and Sealy, B. J. |
| Departments | Faculty of Science > Physics |
| Refereed | Yes |
| Status | Published |
| ID Code | 9021 |
| Additional Information | ID number: ISI:000188300200231 |
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