Research

Micromachined III-V cantilevers for AFM-tracking scanning hall probe microscopy


Reference:

Brook, A. J., Bending, S. J., Pinto, J., Oral, A., Ritchie, D., Beere, H., Springthorpe, A. and Henini, M., 2003. Micromachined III-V cantilevers for AFM-tracking scanning hall probe microscopy. Journal of Micromechanics and Microengineering, 13 (1), pp. 124-128.

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Details

Item Type Articles
CreatorsBrook, A. J., Bending, S. J., Pinto, J., Oral, A., Ritchie, D., Beere, H., Springthorpe, A. and Henini, M.
DepartmentsFaculty of Science > Physics
RefereedYes
StatusPublished
ID Code9076
Additional InformationID number: ISI:000180628400017

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