Research

Integrated piezoresistive sensors for atomic force-guided scanning Hall probe microscopy


Reference:

Brook, A. J., Bending, S. J., Pinto, J., Oral, A., Ritchie, D., Beere, H., Henini, M. and Springthorpe, A., 2003. Integrated piezoresistive sensors for atomic force-guided scanning Hall probe microscopy. Applied Physics Letters, 82 (20), pp. 3538-3540.

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Details

Item Type Articles
CreatorsBrook, A. J., Bending, S. J., Pinto, J., Oral, A., Ritchie, D., Beere, H., Henini, M. and Springthorpe, A.
DepartmentsFaculty of Science > Physics
RefereedYes
StatusPublished
ID Code9077
Additional InformationID number: ISI:000182823300054

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