Research

Defects in GaN films studied by positron annihilation spectroscopy


Reference:

Pi, X. D., Coleman, P. G., Tseng, C. L., Burrows, C. P., Yavich, B. and Wang, W. N., 2002. Defects in GaN films studied by positron annihilation spectroscopy. Journal of Physics-Condensed Matter, 14 (12), L243-L248.

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Details

Item Type Articles
CreatorsPi, X. D., Coleman, P. G., Tseng, C. L., Burrows, C. P., Yavich, B. and Wang, W. N.
DepartmentsFaculty of Science > Physics
RefereedYes
StatusPublished
ID Code9124
Additional InformationID number: ISI:000175333200002

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