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Modeling the fractal growth of templated, mesoporous silica films


Reference:

Edler, K. J., Arrowsmith, M., Hamilton, M. and Rigby, S. P., 2005. Modeling the fractal growth of templated, mesoporous silica films. Journal of Physical Chemistry B, 109 (13), pp. 6294-6303.

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Abstract

Brewster angle micrographs were obtained of the development of a SiO2 film grown at an air-water interface with use of the surfactant template cetylpyridinium chloride. The micrograph images showed that the growing SiO2 film exhibited complex, fractal-like patterns. These images were analyzed to det. the values of the fractal dimension and lacunarity, and the forms of the autocorrelation function and Euclidean crossover behavior of the SiO2 clusters were obsd. These statistical descriptors were compared with the equiv. properties of simulated images of model structures generated by computer using a particular variant of the cluster-cluster aggregation (CCA) algorithm. Good agreement was found between the characteristic properties of typical exptl. images and the simulated images. It was, therefore, suggested that the CCA process is a good model for the growth of the SiO2 films. [on SciFinder (R)]

Details

Item Type Articles
CreatorsEdler, K. J., Arrowsmith, M., Hamilton, M. and Rigby, S. P.
Uncontrolled Keywordssurface structure (fractal growth of templated, fractals, mesoporous sio2 films), mesoporous silica film fractal growth surface structure, porous materials (mesoporous, fractal growth of templated
DepartmentsFaculty of Engineering & Design > Chemical Engineering
RefereedYes
StatusPublished
ID Code916

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