Dichroic behavior of multilayer structures based on anisotropically nanostructured silicon
Reference:
Diener, J., Kunzner, N., Kovalev, D., Gross, E., Koch, F. and Fujii, M., 2002. Dichroic behavior of multilayer structures based on anisotropically nanostructured silicon. Journal of Applied Physics, 91 (10), pp. 6704-6709.
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Abstract
Multilayer structures of anisotropically nanostructured (birefringent) silicon have been fabricated and studied by polarization-resolved reflection and transmission measurements. We demonstrate that stacks of birefringent porous silicon layers with alternating refractive indices and thicknesses act as dichroic Bragg reflectors or dichroic microcavities with a transmission/reflection dependent on the polarization direction of the incident light. The possibility of separate fine tuning of two orthogonally polarized transmission/reflection bands and their spectral splitting is demonstrated. (C) 2002 American Institute of Physics.
Details
| Item Type | Articles |
| Creators | Diener, J., Kunzner, N., Kovalev, D., Gross, E., Koch, F. and Fujii, M. |
| DOI | 10.1063/1.1471581 |
| Departments | Faculty of Science > Physics |
| Refereed | Yes |
| Status | Published |
| ID Code | 9162 |
| Additional Information | ID number: ISI:000175572500069 |
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