Bismuth nano-Hall probes fabricated by focused ion beam milling for direct magnetic imaging by room temperature scanning Hall probe microscopy
Reference:
Sandhu, A., Masuda, H., Kurosawa, K., Oral, A. and Bending, S. J., 2001. Bismuth nano-Hall probes fabricated by focused ion beam milling for direct magnetic imaging by room temperature scanning Hall probe microscopy. Electronics Letters, 37 (22), pp. 1335-1336.
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Details
| Item Type | Articles |
| Creators | Sandhu, A., Masuda, H., Kurosawa, K., Oral, A. and Bending, S. J. |
| Departments | Faculty of Science > Physics |
| Refereed | Yes |
| Status | Published |
| ID Code | 9210 |
| Additional Information | ID number: ISI:000171943100013 |
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