Research

Bismuth nano-Hall probes fabricated by focused ion beam milling for direct magnetic imaging by room temperature scanning Hall probe microscopy


Reference:

Sandhu, A., Masuda, H., Kurosawa, K., Oral, A. and Bending, S. J., 2001. Bismuth nano-Hall probes fabricated by focused ion beam milling for direct magnetic imaging by room temperature scanning Hall probe microscopy. Electronics Letters, 37 (22), pp. 1335-1336.

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Details

Item Type Articles
CreatorsSandhu, A., Masuda, H., Kurosawa, K., Oral, A. and Bending, S. J.
DepartmentsFaculty of Science > Physics
RefereedYes
StatusPublished
ID Code9210
Additional InformationID number: ISI:000171943100013

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