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The study of lattice damage using slow positrons following low energy B+ implantation of silicon


Reference:

Gwilliam, R. M., Knights, A. P., Nejim, A., Sealy, B. J., Burrows, C. P., Malik, F. and Coleman, P. G., 2001. The study of lattice damage using slow positrons following low energy B+ implantation of silicon. Nuclear Instruments & Methods in Physics Research Section B - Beam Interactions with Materials and Atoms, 175, pp. 62-67.

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Details

Item Type Articles
CreatorsGwilliam, R. M., Knights, A. P., Nejim, A., Sealy, B. J., Burrows, C. P., Malik, F. and Coleman, P. G.
DepartmentsFaculty of Science > Physics
RefereedYes
StatusPublished
ID Code9249
Additional InformationID number: ISI:000169389100012

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