The study of lattice damage using slow positrons following low energy B+ implantation of silicon
Reference:
Gwilliam, R. M., Knights, A. P., Nejim, A., Sealy, B. J., Burrows, C. P., Malik, F. and Coleman, P. G., 2001. The study of lattice damage using slow positrons following low energy B+ implantation of silicon. Nuclear Instruments & Methods in Physics Research Section B - Beam Interactions with Materials and Atoms, 175, pp. 62-67.
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Details
| Item Type | Articles |
| Creators | Gwilliam, R. M., Knights, A. P., Nejim, A., Sealy, B. J., Burrows, C. P., Malik, F. and Coleman, P. G. |
| Departments | Faculty of Science > Physics |
| Refereed | Yes |
| Status | Published |
| ID Code | 9249 |
| Additional Information | ID number: ISI:000169389100012 |
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