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Dichroic Bragg reflectors based on birefringent porous silicon


Reference:

Diener, J., Kunzner, N., Kovalev, D., Gross, E., Timoshenko, V. Y., Polisski, G. and Koch, F., 2001. Dichroic Bragg reflectors based on birefringent porous silicon. Applied Physics Letters, 78 (24), pp. 3887-3889.

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Abstract

Multilayers of anisotropically nanostructured silicon (Si) have been fabricated and studied by polarization-resolved reflection measurements. Alternating layers having different refractive indices exhibit additionally a strong in-plane anisotropy of their refractive index (birefringence). Therefore, a stack of layers, acting as a distributed Bragg reflector, has two distinct reflection bands, depending on the polarization of the incident linearly polarized light. This effect is governed by a three-dimensional (in-plane and in-depth) variation of the refractive index. These structures can yield optical effects which are difficult to achieve with conventional Bragg reflectors. (C) 2001 American Institute of Physics.

Details

Item Type Articles
CreatorsDiener, J., Kunzner, N., Kovalev, D., Gross, E., Timoshenko, V. Y., Polisski, G. and Koch, F.
DepartmentsFaculty of Science > Physics
RefereedYes
StatusPublished
ID Code9269
Additional InformationID number: ISI:000169226200041

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