Items by Cai, Bin
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Book Sections
Muelaner, J. E., Cai, B. and Maropoulos, P. G., 2009. Large volume metrology instrument selection and measurability analysis. In: Proceedings of the 6th CIRP-Sponsored International Conference on Digital Enterprise Technology. Vol. 66. Springer-Verlag, pp. 1027-1041. (Advances in Intelligent and Soft Computing)
Articles
Muelaner, J. E., Cai, B. and Maropoulos, P. G., 2010. Large volume metrology instrument selection and measurability analysis. Proceedings of the Institution of Mechanical Engineers, Part B: Journal of Engineering Manufacture, 224 (6), pp. 853-868.
Maropoulos, P. G., Guo, Y., Jamshidi, J. and Cai, B., 2008. Large volume metrology process models: a framework for integrating measurement with assembly planning. CIRP Annals - Manufacturing Technology, 57 (1), pp. 477-480.
Conference or Workshop Items
Cai, B., Dai, W., Muelaner, J. E. and Maropoulos, P. G., 2010. Measurability Characteristics Mapping for Large Volume Metrology Instruments Selection. In: The 7th International Conference on Manufacturing Research (ICMR09), 2009-09-08 - 2009-09-10, University of Warwick.
Cai, B., Maropoulos, P., Guo, Y. and Jamshidi, J., 2008. Large Volume Measurability Analysis for Early Design. In: 5th International Conference on Digital Enterprise Technology (DET08), 2008-10-22 - 2008-10-24, Nantes.
