Items by Edwardson, Charlene
 | Up a level |
Number of items: 10.
Articles
Edwardson, C. J., Coleman, P. G. and El Mubarek, H. A. W., 2014. Positron annihilation studies of fluorine-vacancy complexes in phosphorus- and fluorine-implanted germanium. Semiconductor Science and Technology, 29 (3), 035005.
Romanenko, A., Edwardson, C. J., Coleman, P. G. and Simpson, P. J., 2013. The effect of vacancies on the microwave surface resistance of niobium revealed by positron annihilation spectroscopy. Applied Physics Letters, 102 (23), 232601.
Edwardson, C. J., Coleman, P. G., Paez, D. J., Doylend, J. K. and Knights, A. P., 2013. Direct observation of electron capture and reemission by the divacancy via charge transient positron spectroscopy. Physical Review Letters, 110 (13), 136401.
Coleman, P. G., Edwardson, C. J., Zhang, A., Ma, X., Pi, X. and Yang, D., 2012. Defects in TiO 2 films on p +-Si studied by positron annihilation spectroscopy. Materials Science and Engineering : B, 177 (8), pp. 625-628.
Coleman, P. G., Edwardson, C. J., Knights, A. P. and Gwilliam, R. M., 2012. Vacancy-type defects created by single-shot and chain ion implantation of silicon. New Journal of Physics, 14, 025007.
Edwardson, C. J., Coleman, P. G., El Mubarek, H. A. W. and Gandy, A. S., 2012. Positron annihilation studies of fluorine-vacancy complexes in Si and SiGe. Journal of Applied Physics, 111 (7), 073510.
Edwardson, C. J., Coleman, P. G., Li, T. T. A., Cuevas, A. and Ruffell, S., 2012. Positron annihilation studies of the AlO xSiO 2Si interface in solar cell structures. Journal of Applied Physics, 111 (5), 053515.
Coleman, P. G., Nash, D., Edwardson, C. J., Knights, A. P. and Gwilliam, R. M., 2011. The evolution of vacancy-type defects in silicon-on-insulator structures studied by positron annihilation spectroscopy. Journal of Applied Physics, 110 (1), 016104.
Edwardson, C. J., Grogan, M. D. W., Birks, T. A. and Coleman, P. G., 2011. Positron and positronium studies of silica aerogel. Journal of Physics: Conference Series, 262 (1), 012018.
Thesis
Edwardson, C. J., 2013. Positron Studies of Defects in Thin Films and Semiconductors. Thesis (Doctor of Philosophy (PhD)). University of Bath.
